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Improved Accuracy for Trace Element Analysis of Al and Ti in Quartz by Electron Probe Microanalysis
Cui, JQ (Cui, Ji-Qiang)1; Yang, SY (Yang, Shui-Yuan)1; Jiang, SY (Jiang, Shao-Yong)1,2,3; Xie, J (Xie, Jing)4
Source PublicationMICROSCOPY AND MICROANALYSIS
2019
Volume25Issue:1Pages:47-57
DOI10.1017/S1431927618015672
Abstract

The trace elements in quartz, Al and Ti, contain considerable information about mineral genesis, and determining their concentrations is of great importance in geology. Electron probe microanalysis has the advantages of non-destructive testing and high spatial resolution; however, it is a challenge to improve the accuracy and precision of trace element detection using this method. The important factors affecting accuracy include the fragility of quartz lattices at high beam currents and the methods used to determine the background. In this paper, the peaks of Al-K alpha and Ti-K alpha, and their backgrounds, were found to exhibit intensity variations at high beam currents and small beam diameters; therefore, it is necessary to select a large beam diameter (up to 20 mu m) to avoid variations in intensity at high currents (500 nA). For background determination of Al, a multipoint background method is proposed to determine the background value, which greatly improves the accuracy of the results. For Ti, the choice of background measurement does not affect the result. In addition, it is verified that the background obtained from other quartz samples can be used as the background of an unknown quartz sample, which reduces the analysis time and minimizes sample damage.

Subject AreaGeosciences
WOS IDWOS:000465593800005
Language英语
Indexed BySCI
KeywordCathodoluminescence Chemistry Microprobe Granite Crystallization Textures Insights
WOS Research AreaMaterials Science ; Microscopy
WOS SubjectMaterials Science, Multidisciplinary ; Microscopy
Cooperation Status国内
ISSN1431-9276
Department大陆碰撞与高原隆升
URL查看原文
PublisherCAMBRIDGE UNIV PRESS
SubtypeArticle
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Document Type期刊论文
Identifierhttp://ir.itpcas.ac.cn/handle/131C11/9402
Collection图书馆
Corresponding AuthorYang, SY (Yang, Shui-Yuan)
Affiliation1.China Univ Geosci, State Key Lab Geol Proc & Mineral Resources, Wuhan 430074, Hubei, Peoples R China;
2.China Univ Geosci, Fac Earth Resources, Wuhan 430074, Hubei, Peoples R China;
3.China Univ Geosci, Collaborat Innovat Ctr Scarce & Strateg Mineral R, Wuhan 430074, Hubei, Peoples R China;
4.Chinese Acad Sci, Inst Tibetan Plateau Res, Key Lab Continental Collis & Plateau Uplift, Beijing 100101, Peoples R China.
Recommended Citation
GB/T 7714
Cui, JQ ,Yang, SY ,Jiang, SY ,et al. Improved Accuracy for Trace Element Analysis of Al and Ti in Quartz by Electron Probe Microanalysis[J]. MICROSCOPY AND MICROANALYSIS,2019,25(1):47-57.
APA Cui, JQ ,Yang, SY ,Jiang, SY ,&Xie, J .(2019).Improved Accuracy for Trace Element Analysis of Al and Ti in Quartz by Electron Probe Microanalysis.MICROSCOPY AND MICROANALYSIS,25(1),47-57.
MLA Cui, JQ ,et al."Improved Accuracy for Trace Element Analysis of Al and Ti in Quartz by Electron Probe Microanalysis".MICROSCOPY AND MICROANALYSIS 25.1(2019):47-57.
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