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Improved Accuracy for Trace Element Analysis of Al and Ti in Quartz by Electron Probe Microanalysis 期刊论文
MICROSCOPY AND MICROANALYSIS, 2019, 卷号: 25, 期号: 1, 页码: 47-57
Authors:  Cui, JQ (Cui, Ji-Qiang);  Yang, SY (Yang, Shui-Yuan);  Jiang, SY (Jiang, Shao-Yong);  Xie, J (Xie, Jing)
Adobe PDF(1245Kb)  |  Favorite  |  View/Download：472/0  |  Submit date：2020/11/24
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